Agilent Technologies 81640A Stud Sensor User Manual


 
Performance Tests Test Record
158 Agilent 81480A and 81680A, 40A, 82A, 42A, & 89A Tunable Laser Modules Users Guide,
Sixth Edition
Agilent 81642A Performance Test
Page 6 of 12
Model Agilent 81642A Tunable Laser Report No. ________ Date_______
Wavelength Repeatability
Measurement Uncertainty: ±0.1 pm
Repeatability of
1510.000 nm (= reference) Measurement Result
Repeatability of
1580.000 nm (= reference) Measurement Result
Initial Setting REF = nm Initial Setting REF = nm
from 1540.000 nm to REF nm from 1510.000 nm to REF nm
from 1580.000 nm to REF nm from 1540.000 nm to REF nm
from 1610.000 nm to REF nm from 1610.000 nm to REF nm
from 1640.000 nm to REF nm from 1640.000 nm to REF nm
largest measured wavelength nm largest measured wavelength nm
smallest measured wave-
length
nm smallest measured wave-
length
nm
Wavelength Repeatability nm Wavelength Repeatability nm
= largest measured wavelength - smallest measured wave-
length
= largest measured wavelength - smallest measured wave-
length
Specification 0.002 nm Specification 0.002 nm
typical 0.001 nm typical 0.001 nm
Repeatability of
1640.000 nm (= reference)
Measurement
Result
Initial Setting REF = nm
from 1510.000 nm to REF nm
from 1540.000 nm to REF nm
from 1580.000 nm to REF nm
from 1610.000 nm to REF nm
largest measured wavelength nm
smallest measured wavelength nm
Wavelength Repeatability nm
= largest measured wavelength - smallest measured wave-
length
Specification 0.002 nm
typical 0.001 nm