Agilent Technologies 81640A Stud Sensor User Manual


 
Definition of Terms Specifications
Agilent 81480A and 81680A, 40A, 82A, 42A, & 89A Tunable Laser Modules Users Guide, Sixth Edition 45
Power Stability
The change of the power level during given time span, expressed as ±
half the span (in dB) between the highest and lowest actual power.
Conditions: uninterrupted TLS output power, constant wavelength
and power level settings, temperature within ±1 K, time span as
specified.
Measurement with optical power meter.
Relative Intensity Noise (RIN)
The square of the (spectrally resolved) RMS optical power amplitude
divided by the measurement bandwidth and the square of the average
optical power, expressed in dB/Hz.
Conditions: at specified output power, coherence control off,
temperature within operating temperature range, frequency range 0.1
to 6 GHz.
Measurement with Agilent Lightwave Signal Analyzer.
Relative Wavelength Accuracy
When randomly changing the wavelength and measuring the
differences between the actual and displayed wavelengths, the relative
wavelength accuracy is ± half the span between the maximum and the
minimum value of all differences.
Conditions: uninterrupted TLS output power, constant power level,
temperature within operating temperature range, observation time 10
minutes maximum (constant temperature), coherence control off,
measured at high power output.
Measurement with wavelength meter. Averaging time given by
wavelength meter, 1 s.
NOTE The relative wavelength accuracy of Output 1, the Low SSE Output, of
the Agilent 81640A/80A Tunable Laser modules is the same as the
relative wavelength accuracy of Output 2, the High Power Output
(guaranteed by design).
Return Loss
The ratio of optical power incident to the TLS output port, at the TLS's
own wavelength, to the power reflected from the TLS output port.
Conditions: TLS disabled.