Agilent Technologies 81689A Stud Sensor User Manual


 
Tunable Laser Module Specifications Specifications
Agilent 81480A and 81680A, 40A, 82A, 42A, & 89A Tunable Laser Modules Users Guide, Sixth Edition 49
Power flatness versus wavelength
3, 9
±0.2 dB, typ. ±0.1 dB
(1420-1480nm)
±0.2 dB typ (1370nm-1420nm)
±0.3 dB, typ. ±0.2 dB
(1420nm-1480nm)
±0.3 dB typ (1370nm-1420nm)
Side-mode suppression ratio (typ.)
4, 8, 9
> 40 dBc (1380 - 1480 nm)
Signal-to-Source Spontaneous Emission
Ratio
5, 8
> 61 dB/nm [7]
(1420 1470 nm)
> 55 dB/nm [7] [9]
(typ., 1370 1480 nm)
> 40 dB/ nm
(1420 1470 nm)
> 35 dB/ nm
(1370 1480 nm)
Signal-to-Total-Source Spontaneous
Emission ratio
6, 8
> 58 dB
(1420 1470 nm) [7]
> 53 dB
(typ., 1370 - 1480 nm) [7] [9]
> 28 dB
(typ., 1420 - 1470 nm )
Relative intensity noise (RIN, typ.)
8
-145 dB/Hz (1420 - 1470 nm)
1. Valid for one month and within a ±5 K temperature range after automatic wavelength zeroing.
2. At CW operation. Measured with wavelength meter based on wavelength in vacuum.
3. Applies to the selected output.
4. Measured by heterodyning method.
5. Measured with optical spectrum analyzer at 1 nm resolution bandwidth.
6. Measured with optical spectrum analyzer.
7. Measured with fiber Bragg grating to suppress the signal.
8. Output power as specified per wavelength range and output port.
9. Wavelength must not be equal to any water absorption line