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e-STUDIO160/200/250 ADJUSTMENT ITEMS 1 - 34 December 2002 TOSHIBA TEC
Power ON
SET
Cancel
1 3
07.CLOCK IC TEST
Select test menu
(7) 07. CLOCK IC TEST
After programming the fixed data and time on the clock IC, the test reads the programmed data and time
and checks whether or not they are correct
<Key used in operation> <Display messages>
CLOCK IC TEST
NG
FUNCTION TEST
05.SRAM TEST
06.DRAM TEST
07.CLOCK IC TEST
Power ON
SET
Cancel
1 3
08.SCANNER TEST
Select test menu
(8) 08. SCANNER TEST
The read/write test is performed on the RAM built in the image processing LSI.
<Key used in operation> <Display messages>
SCANNER TEST
OK
SCANNER TEST
NG
FUNCTION TEST
06.DRAM TEST
07.CLOCK IC TEST
08.SCANNER TEST
CLOCK IC TEST
OK
or
or