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IN-6 C141-E050-02EN
T
Temperature, ambient 3-5
Temperature, range 1-2
Temperature measurement point, surface
3-5
Temperature range 1-2
Theory of device operation 4-1
Time, average positioning 1-2
Time base generator circuit 4-13
Time between failures, mean 1-8
Time to repair, mean 1-8
Timing 5-76
Timing, data transfer 5-77
Timing, execution of self-calibration 4-8
Timing, multiword DMA data transfer 5-79
Timing, power 5-80
Timing, reset 5-80
Timing, single word DMA data transfer
5-78
Track following operation 4-20
Transfer rate, data 4-13
U
Translation, address 6-7, 6-8
Unrecoverable read error 1-9
Usage of read segment 6-16
User password 5-66
V
VCM 4-3
VCM current sense resistor (CSR) 4-17
Vibration 1-8
Viterbi detection circuit 4-13
Voice coil motor 4-3
W
WRITE BUFFER 5-46
Write cache 1-3, 6-22
Write circuit 4-10
WRITE DMA 5-26
WRITE LONG 5-44
WRITE MULTIPLE 5-25
Write precompiled 4-10
Write precompiled algorithm 4-10
Write/read recovery 4-19
WRITE SECTOR(S) 5-23
WRITE SECTOR(S) command protocol
5-72
WRITE VERIFY 5-27