In-Sight
®
1700 Series Wafer Reader Section 3: Configuring a Wafer ID Application
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3.4.16 Read
The Read button, below the Config settings, acquires an image and performs a “test”
read on the wafer mark using the current Config. The String and Score results are
reported to the right. If the read passes, the String appears on a green background; failed
reads appear on a red background.
3.5 Setting Options
The selections in the Options tab (Figure 3-9) control how the configured wafer ID
application will operate during runtime.
Figure 3-9: Options Tab
3.5.1 Read
Read options control the try sequence for enabled Configs. Optionally, image acquisition
can be disabled to allow test reads from image files when the reader is offline.
Read Timeout & Read Order
Read Timeout specifies the total amount of time (up to 60 seconds) to allow for a read,
including retries and tuning of enabled Configs. When the timeout limit is reached without
a successful read, the read fails.
NOTE Specifying a Read Timeout differs from terminating the execution of the read using the Abort
Execution command. For more information on this command, , refer to Section 7: Native Mode
Commands.
