Tektronix TDS5000B Series Sander User Manual


 
Specifications
1-4
TDS5000B Series Specifications and Performance Verification
Average, Envelope, and Hi Res Acquisition. Use Average acquisition mode to
remove uncorrelated noise from your signal. Use Envelope to capture and
display the maximum variation of the signal. Use Hi Res to increase vertical
resolution for lower bandwidth signals.
Waveform Math. Set up simple math waveforms using the basic arithmetic
functions including FF T, or create more advanced math waveforms using the
optional math expression editor. Waveform expressions can even contain
measurement results and other math waveforms.
Spectral Analysis. Display spectral magnitude and phase waveforms based on
your time-domain acquisitions. Control the oscilloscope using the traditional
spectrum analyzer controls such as span and center frequency.
Color LCD Display. Identify and differentiate waveforms easily with color coding.
Waveforms, readouts, and inputs are color matched to increase productivity and
reduce operating errors.
Digital Phosphor. A Digital Phosphor Oscilloscope can clearly display intensity
modulation in your signals. The oscilloscope automatically overlays subsequent
acquisitions and then decays them to simulate the writing and decay of the
phosphor in an analog oscilloscope CRT (cathode-ray tube). The feature results
in an intensity-graded or color-graded waveform display that shows the
information in the intensity modulation.
Fit to Screen. The Digital Phosphor technology performs the compression
required to represent all record points on the screen, even at the maximum record
length settings.
Zoom. To take advantage of the full resolution of the oscilloscope you can zoom
in on a waveform to see the fine details. Both vertical and horizontal zoom
functions are available.
Cursors. Use cursors to take simple voltage, time, and frequency measurements.
Automatic Measurements. Choose from a large palette of amplitude, time, and
histogram measurements. You can customize the measurements by changing
reference levels or by adding measurement gating.
Signal Processing
Features
Display Features
Measurement Features