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Table of Contents
ii
TDS5000B Series Specifications and Performance Verification
List of Figures
Figure 2 --1: Toolbar and menu bar 2--3...........................
Figure 2--2: Un iversal test hook up for fun ctional tests --
CH 1 shown 2--7...........................................
Figure 2 --3: Channel button location 2--8..........................
Figure2--4:Setupfortimebasetest 2--9...........................
Figure 2--5: Setup for trigger test 2--11.............................
Figure 2--6: S etup for the file system test 2--13.......................
Figure 2--7: E xample test p age from the internal printer 2--15.........
Figure 2--8: In itial test h ookup 2--25...............................
Figure 2--9: Measur ement of DC accuracy at maximum offset
and position 2--27...........................................
Figure 2--10: In itial test h ookup 2--29..............................
Figure 2-- 11: Optional initial test hookup 2--29......................
Figure 2--12: Measurement of analog bandwidth 2--32................
Figure 2--13: In itial test h ookup 2--34..............................
Figure 2--14: Measurement of channel delay 2--36...................
Figure 2--15: In itial test h ookup 2--37..............................
Figure 2--16: In itial test h ookup 2--39..............................
Figure 2--17: Measurement of accuracy --
long-term and delay time 2--41................................
Figure 2--18: Delta time accuracy test hookup 2--42..................
Figure 2--19: In itial test h ookup 2--45..............................
Figure 2--20: Measurement of time accuracy for pulse and
glitch triggering 2--46........................................
Figure 2--21: In itial test h ookup 2--48..............................
Figure 2--22: Measurement of trigger sensitivity showing
50 MHz results 2--50.........................................
Figure 2--23: In itial test h ookup 2--53..............................
Figure 2--24: Measurement of main trigger out limits 2--55............
Figure 2--25: In itial test h ookup 2--56..............................
Figure 2--26: Measurement of probe compensator frequency 2--57......
Figure 2 --27: Subsequent test hookup 2--58.........................
Figure 2--28: Measurement of probe compensator amplitude 2--59......
Figure 2 --29: Sine wave generator leveling equipment setup
(Method A) 2--60............................................