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TDS5000B Series Specifications and Performance Verification
Table 1-2: Channel input and vert ical specifications (Cont.)
Characteristic Description
Delta voltage measurement
between any two averages
of ≥16 waveforms acquired
under t he same setup and
ambient conditions
±[1.5% + 1.0% × |net
offset /offset range|×
|reading -- net offset| +
(0.1 div × V/div set ting) +
0.3 mV]
TDS5104B: 2 mV/div --
3.98 mV/div
±[1.5% + 3.0% × |net
offset /offset range|×
|reading -- net offset|
+0.1div× V/div
+0.3mV]
Where, net offset = offset -- (position × volts/division)
Nonlinearity, typical <1 LSB differential, <1 LSB integral, independently
based
Effective bits, typical Sine wave input at the indicated frequency and pk-pk
amplitude, 50 mV/div and 25 °C
Signal and input conditions Effective bits
TDS5032B, TDS5034B,
TDS5052B, TDS5054B,
TDS5054BE
1MHz,9.2div,5GS/s
sample rate, Sample
acquisition mode
6.8 bits
1MHz,9.2div,10MS/s
sample rate, HiRes acquisi-
tion m ode
9.1 bits
TDS5032B, TDS5034B 350 MHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
6.5 bits
TDS5052B, TDS5054B,
TDS5054BE
500 MHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
6.5 bits
TDS5104B 1MHz,9.2div,5GS/s
sample rate, Sample
acquisition mode
6.6 bits
1MHz,9.2div,10MS/s
sample rate, HiRes acquisi-
tion m ode
9.0 bits
1GHz,6.5div,5GS/s
sample rate, Sample
acquisition mode
4.7 bits