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NI-DAQ FRM for PC Compatibles I-2
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National Instruments Corporation
SCAN_Sequence_Demux,
2-300 to 2-302
SCAN_Sequence_Retrieve, 2-303
SCAN_Sequence_Setup, 2-304 to 2-306
SCAN_Setup, 2-307 to 2-308
SCAN_Start, 2-309 to 2-314
Select_Signal, 2-372 to 2-388
analog output calibration, SCXI modules,
2-328 to 2-329
analog output functions. See also waveform
generation functions.
AO_Change_Parameter, 2-27 to 2-37
AO_Configure, 2-38 to 2-41
AO_Update, 2-42
AO_VScale, 2-43 to 2-44
AO_VWrite, 2-45 to 2-46
AO_Write, 2-47 to 2-48
definition, 1-13
LabWindows function panel tree,
1-8 to 1-9
NI-DAQ function support (table)
DAQArb, AO-2DC, AT-AO-6/10,
and VXI-AO-48XDC devices,
C-11 to C-12
Lab/516/DAQCard-500/700
functions, C-6, C-8
MIO and AI devices, C-2, C-5
analog trigger event (figure), 2-70
AO_Calibrate function, 2-25 to 2-26
AO_Change_Parameter function, 2-27 to 2-37
analog filter, 2-31
buffer interrupts, 2-36
DAQArb 5411 device parameters,
2-31 to 2-36
description, 2-27 to 2-28
digital filter, 2-31
FIFO transfer condition, 2-29 to 2-30
FIFO transfer count, 2-30 to 2-31
frequency correction for analog filter,
2-33 to 2-34
ground DAC reference, 2-31
memory transfer width, 2-37
output attenuation, 2-33
output enable, 2-32
output impedance, 2-32
PLL reference frequency, 2-35
reglitching, 2-28
SYNC duty cycle, 2-35 to 2-36
trigger mode, 2-34 to 2-35
using the function, 2-26 to 2-37
voltage or current output, 2-28 to 2-29
AO_Configure function, 2-38 to 2-41
AO_Update function, 2-42
AO_VScale function, 2-43 to 2-44
AO_VWrite function, 2-45 to 2-46
AO_Write function, 2-47 to 2-48
arrays, 1-3
B
block transfer digital I/O functions. See digital
I/O functions.
board numbers. See device numbers.
boards, terminology for (table), xvii-xviii
board-specific functions
AI_MUX_Config, 2-10 to 2-11
AO_Calibrate, 2-25 to 2-26
Calibrate_1200, 2-49 to 2-54
LPM16_Calibrate, 2-279
MIO_Calibrate, 2-280 to 2-283
MIO_Config, 2-284 to 2-285
SC_2040_Config, 2-292 to 2-293
Borland Delphi, 1-4
buffer interrupts, enabling/disabling, 2-36
buffered counting and time measurement
event counting application,
2-235 to 2-237
period measurement application,
2-237 to 2-239
pulse width measurement application,
2-240 to 2-241