Mitsubishi Electronics QCPU Welding System User Manual


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Appendix1 OPERATION PROCESSING TIME
Appendix 1.4 Operation Processing Time of Universal Model QCPU
Category Instruction Condition (Device)
Processing Time (µs)
Q00UJCPU Q00UCPU
Q01UCPU Q02UCPU
Min. Max. Min. Max. Min. Max. Min. Max.
Application
instruction
ANDTM<=
When not executed
0.480 0.320 0.240 0.160
Comparison
of specified
ciock
In conductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.000 23.000
In nonconductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.000 23.000
Comparison
of current
ciock
In conductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.600 21.900
In nonconductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.600 21.900
ORTM<=
When not executed
0.480 0.320 0.240 0.160
Comparison
of specified
ciock
In conductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.200
In nonconductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.200
Comparison
of current
ciock
In conductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.000
In nonconductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.000
LDTM<
Comparison
of specified
ciock
In conductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.300
In nonconductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.300
Comparison
of current
ciock
In conductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.100
In nonconductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.100
ANDTM<
When not executed
0.480 0.320 0.240 0.160
Comparison
of specified
ciock
In conductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.000 23.000
In nonconductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.000 23.000
Comparison
of current
ciock
In conductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.600 21.900
In nonconductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.600 21.900
ORTM<
When not executed
0.480 0.320 0.240 0.160
Comparison
of specified
ciock
In conductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.200
In nonconductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.200
Comparison
of current
ciock
In conductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.000
In nonconductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.000
LDTM>=
Comparison
of specified
ciock
In conductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.300
In nonconductive
status
8.200 25.500 8.200 25.500 6.500 25.500 7.300 23.300
Comparison
of current
ciock
In conductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.100
In nonconductive
status
6.500 23.100 6.500 23.100 6.500 23.100 5.900 22.100
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